-
1
-
-
0032099414
-
Modeling stresses of contacts in wiresaw slicing of polycrystalline and crystalline ingots: Application to silicon wafer production
-
J. Li, I. Kao, and V. Prasad Modeling stresses of contacts in wiresaw slicing of polycrystalline and crystalline ingots: application to silicon wafer production Journal of Electronic Packaging 120 2 1998 123 128
-
(1998)
Journal of Electronic Packaging
, vol.120
, Issue.2
, pp. 123-128
-
-
Li, J.1
Kao, I.2
Prasad, V.3
-
3
-
-
0034174401
-
Elasto-hydrodynamic interaction in the free abrasive wafer slicing using a wiresaw: Modeling and finite element analysis
-
M. Bhagavat, V. Prasad, and I. Kao Elasto-hydrodynamic interaction in the free abrasive wafer slicing using a wiresaw: modeling and finite element analysis Journal of Tribology 122 2 2000 394 404
-
(2000)
Journal of Tribology
, vol.122
, Issue.2
, pp. 394-404
-
-
Bhagavat, M.1
Prasad, V.2
Kao, I.3
-
4
-
-
0032024951
-
Towards an integrated approach for analysis and design of wafer slicing by a wire saw
-
R. Sahoo, V. Prasad, I. Kao, J. Talbott, and K. Gupta Towards an integrated approach for analysis and design of wafer slicing by a wire saw Journal of Electronic Packaging 120 1 1998 35 40
-
(1998)
Journal of Electronic Packaging
, vol.120
, Issue.1
, pp. 35-40
-
-
Sahoo, R.1
Prasad, V.2
Kao, I.3
Talbott, J.4
Gupta, K.5
-
5
-
-
0039972624
-
Vibration analysis of wire and frequency response in the modern wiresaw manufacturing process
-
S. Wei, and I. Kao Vibration analysis of wire and frequency response in the modern wiresaw manufacturing process Journal of Sound and Vibration 231 5 2000 1383 1395
-
(2000)
Journal of Sound and Vibration
, vol.231
, Issue.5
, pp. 1383-1395
-
-
Wei, S.1
Kao, I.2
-
6
-
-
15944387989
-
Galerkin-based modal analysis on the vibration of wire-slurry system in wafer slicing using wiresaw
-
In press
-
L. Zhu, I. Kao, Galerkin-based modal analysis on the vibration of wire-slurry system in wafer slicing using wiresaw, Journal of Sound and Vibration (In press).
-
Journal of Sound and Vibration
-
-
Zhu, L.1
Kao, I.2
-
7
-
-
4043128141
-
Basic mechanisms and models of multi-wire sawing
-
H.J. Moller Basic mechanisms and models of multi-wire sawing Advanced Engineering Materials 6 7 2004 501 513
-
(2004)
Advanced Engineering Materials
, vol.6
, Issue.7
, pp. 501-513
-
-
Moller, H.J.1
-
8
-
-
0036909997
-
Prediction of warping in silicon wafer slicing with wire saw machine
-
T. Yamada, M. Fukunaga, T. Ichikawa, K. Furuno, K. Makino, and A. Yokoyama Prediction of warping in silicon wafer slicing with wire saw machine Theoretical and Applied Mechanics 51 2002 251 258
-
(2002)
Theoretical and Applied Mechanics
, vol.51
, pp. 251-258
-
-
Yamada, T.1
Fukunaga, M.2
Ichikawa, T.3
Furuno, K.4
Makino, K.5
Yokoyama, A.6
-
9
-
-
0037063907
-
Finite element analysis for grinding and lapping of wire-sawn silicon wafers
-
W. Liu, Z. Pei, and X. Xin Finite element analysis for grinding and lapping of wire-sawn silicon wafers Journal of Materials Processing Technology 129 1-3 2002 2 9
-
(2002)
Journal of Materials Processing Technology
, vol.129
, Issue.1-3
, pp. 2-9
-
-
Liu, W.1
Pei, Z.2
Xin, X.3
-
10
-
-
0037210538
-
Finite element analysis for grinding of wire-sawn silicon wafers: A designed experiment
-
Z. Pei, X. Xin, and W. Liu Finite element analysis for grinding of wire-sawn silicon wafers: a designed experiment International Journal of Machine Tools and Manufacture 43 1 2003 7 16
-
(2003)
International Journal of Machine Tools and Manufacture
, vol.43
, Issue.1
, pp. 7-16
-
-
Pei, Z.1
Xin, X.2
Liu, W.3
-
11
-
-
0037392106
-
Fixed abrasive diamond wire machining - Part i: Process monitoring and wire tension force
-
W. Clark, A. Shih, C. Hardin, R. Lemaster, and S. McSpadden Fixed abrasive diamond wire machining - part i: process monitoring and wire tension force International Journal of Machine Tools and Manufacture 43 5 2003 523 532
-
(2003)
International Journal of Machine Tools and Manufacture
, vol.43
, Issue.5
, pp. 523-532
-
-
Clark, W.1
Shih, A.2
Hardin, C.3
Lemaster, R.4
McSpadden, S.5
-
12
-
-
0037392244
-
Fixed abrasive diamond wire machining - Partexperiment design and results
-
W. Clark, A. Shih, R. Lemaster, and S. McSpadden Fixed abrasive diamond wire machining - partexperiment design and results International Journal of Machine Tools and Manufacture 43 5 2003 533 542
-
(2003)
International Journal of Machine Tools and Manufacture
, vol.43
, Issue.5
, pp. 533-542
-
-
Clark, W.1
Shih, A.2
Lemaster, R.3
McSpadden, S.4
-
14
-
-
0026154663
-
Ductile-regime grinding: A new technology for machining of brittle materials
-
T. Bifano, T. Dow, and R. Scattergood Ductile-regime grinding: a new technology for machining of brittle materials Journal of Engineering for Industry 113 2 1991 184 189
-
(1991)
Journal of Engineering for Industry
, vol.113
, Issue.2
, pp. 184-189
-
-
Bifano, T.1
Dow, T.2
Scattergood, R.3
-
15
-
-
84975634755
-
Physics of loose abrasive microgrinding
-
D. Goloni, and S. Jacobs Physics of loose abrasive microgrinding Applied Optics 30 19 1991 2761 2777
-
(1991)
Applied Optics
, vol.30
, Issue.19
, pp. 2761-2777
-
-
Goloni, D.1
Jacobs, S.2
-
16
-
-
0018926872
-
Abrasive wear of brittle solids
-
M. Moore, and F. King Abrasive wear of brittle solids Wear 60 1 1980 123 140
-
(1980)
Wear
, vol.60
, Issue.1
, pp. 123-140
-
-
Moore, M.1
King, F.2
-
18
-
-
0020206952
-
Elastic plastic indentation damage in ceramics - The lateral crack system
-
D. Marshall, B. Lawn, and A. Evans Elastic plastic indentation damage in ceramics - the lateral crack system Journal of the American Ceramic Society 65 11 1982 561 566
-
(1982)
Journal of the American Ceramic Society
, vol.65
, Issue.11
, pp. 561-566
-
-
Marshall, D.1
Lawn, B.2
Evans, A.3
-
20
-
-
0027624527
-
Three-body abrasion of brittle materials as studied by lapping
-
M. Buijs, and K.K. Houten Three-body abrasion of brittle materials as studied by lapping Wear 166 2 1993 237 245
-
(1993)
Wear
, vol.166
, Issue.2
, pp. 237-245
-
-
Buijs, M.1
Houten, K.K.2
-
21
-
-
30344431727
-
-
Wire sawing device, U.S. Patent 5,910,203
-
C. Hauser, Wire sawing device, U.S. Patent 5,910,203.
-
-
-
Hauser, C.1
-
22
-
-
30344488956
-
-
Apparatus and method for reducing bow and warp in silicon wafers sliced by a wire saw, U.S. Patent 6,352,071
-
O. Konunchuk, G. Preece, Apparatus and method for reducing bow and warp in silicon wafers sliced by a wire saw, U.S. Patent 6,352,071.
-
-
-
Konunchuk, O.1
Preece, G.2
-
24
-
-
0003760432
-
Properties of crystalline silicon
-
R. Hull EMIS Datareviews No. 20
-
R. Hull Properties of crystalline silicon R. Hull EMIS Datareviews No. 20 INSPEC 1999
-
(1999)
INSPEC
-
-
Hull, R.1
-
25
-
-
30344488372
-
-
Method and device for cutting single crystal sapphire substrate, Japanese Patent 2003-320521
-
H. Ogawa, M. Nakai, Method and device for cutting single crystal sapphire substrate, Japanese Patent 2003-320521.
-
-
-
Ogawa, H.1
Nakai, M.2
-
26
-
-
0010032509
-
Bicrystallography of the epitaxic systems 'iii-v' nitrides on sapphire: Theory and experiment
-
A. Efimov, A. Lebedev, and A. Tsaregorodtsev Bicrystallography of the epitaxic systems 'iii-v' nitrides on sapphire: theory and experiment Journal of Applied Crystallography 31 3 1998 461 473
-
(1998)
Journal of Applied Crystallography
, vol.31
, Issue.3
, pp. 461-473
-
-
Efimov, A.1
Lebedev, A.2
Tsaregorodtsev, A.3
-
27
-
-
0001142981
-
Elastic constants of synthetic single crystal corundum at room temperature
-
J. Wachtman, W. Tefft, D. Lam, and R. Stinchfield Elastic constants of synthetic single crystal corundum at room temperature Journal of Research of the National Bureau of Standards - A Physics and Chemistry 64A 3 1960 213 228
-
(1960)
Journal of Research of the National Bureau of Standards - A Physics and Chemistry
, vol.64
, Issue.3
, pp. 213-228
-
-
Wachtman, J.1
Tefft, W.2
Lam, D.3
Stinchfield, R.4
-
28
-
-
2442463480
-
Fixed abrasive diamond wire saw slicing of single-crystal silicon carbide wafers
-
C. Hardin, J. Qu, and A. Shih Fixed abrasive diamond wire saw slicing of single-crystal silicon carbide wafers Materials and Manufacturing Processes 19 2 2004 355 367
-
(2004)
Materials and Manufacturing Processes
, vol.19
, Issue.2
, pp. 355-367
-
-
Hardin, C.1
Qu, J.2
Shih, A.3
-
29
-
-
30344434278
-
-
Method of slicing semiconductor single crystal ingot, European Patent EP0798092
-
K. Toyama, K. Hayakawa, E. Kiuchi, Method of slicing semiconductor single crystal ingot, European Patent EP0798092.
-
-
-
Toyama, K.1
Hayakawa, K.2
Kiuchi, E.3
-
30
-
-
0027590599
-
Dislocation loops at crack tips - Nucleation and growth - An experimental study in silicon
-
A. George, and G. Michot Dislocation loops at crack tips - nucleation and growth - an experimental study in silicon Materials Science and Engineering A 164 1-2 1993 118 134
-
(1993)
Materials Science and Engineering A
, vol.164
, Issue.1-2
, pp. 118-134
-
-
George, A.1
Michot, G.2
-
31
-
-
0038786031
-
An ab initio study of the cleavage anisotropy in silicon
-
R. Perez, and P. Gumbsch An ab initio study of the cleavage anisotropy in silicon Acta Materialia 48 18-19 2000 4517 4530
-
(2000)
Acta Materialia
, vol.48
, Issue.18-19
, pp. 4517-4530
-
-
Perez, R.1
Gumbsch, P.2
-
32
-
-
28844492016
-
Technology and research of slurry wiresaw manufacturing systems in wafer slicing with free abrasive machining
-
I. Kao Technology and research of slurry wiresaw manufacturing systems in wafer slicing with free abrasive machining International Journal of Advanced Manufacturing Systems 7 2 2004 7 20
-
(2004)
International Journal of Advanced Manufacturing Systems
, vol.7
, Issue.2
, pp. 7-20
-
-
Kao, I.1
-
33
-
-
30344488064
-
-
Channel-cut monochromator, US Patent 6,574,306
-
T. Kikuchi, Channel-cut monochromator, US Patent 6,574,306.
-
-
-
Kikuchi, T.1
|