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Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 390-399
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Investigation of bandgap states using the modulated photocurrent technique in both high and low frequency regimes
a
UNIV PARIS SUD
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CARRIER MOBILITY;
ELECTRIC FIELDS;
ELECTRODES;
MODULATION;
PHOTOCURRENTS;
PHOTONS;
SILICON;
THIN FILMS;
BANDGAP STATES;
HIGH FREQUENCY REGIME (HF);
LOW FREQUENCY REGIME (LF);
TRANSIENT PHOTOCURRENT (TPC);
SEMICONDUCTOR DEVICES;
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EID: 2942562351
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2004.03.005 Document Type: Conference Paper |
Times cited : (18)
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References (40)
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