Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si,Ge:H alloys

Journal of Non-Crystalline Solids

Volumn 299-302, Issue , 2002, Pages 449-454

  Cohen, J David ^a   Heath, Jennifer ^a   Palinginis, Kimon ^a   Yang, Jeffrey C ^b   Guha, Subhendu ^b  

^a UNIVERSITY OF OREGON   (United States)

^b United Solar Systems Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; GERMANIUM ALLOYS; PHOTOCURRENTS; PHOTODEGRADATION;

LIGHT-INDUCED DEGRADATIONS; MODULATED PHOTOCURRENT (MPC) METHOD;

AMORPHOUS SILICON;

EID: 0036540306     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)01172-3     Document Type: Article

References (13)