Retrieval process of high-resolution HAADF-STEM images

Journal of Electron Microscopy

Volumn 51, Issue 6, 2002, Pages 383-390

  Nakanishi, Nobuto ^a   Yamazaki, Takashi ^a   Rečnik, Aleksander ^b   Čeh, Miran ^b   Kawasaki, Masahiro ^f   Watanabe, Kazuto ^c   Shiojiri, Makoto ^d,e  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

^d KANAZAWA MEDICAL UNIVERSITY   (Japan)

^e KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^f NONE

Author keywords

Atomic resolution; Deconvolution maximum entropy method; HAADF STEM; Image processing; Sb2O3 doped ZnO

Indexed keywords

ARTICLE;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; MAXIMUM ENTROPY METHODS; PROBES; SCANNING ELECTRON MICROSCOPY; ZINC OXIDE;

ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; ATOMIC-RESOLUTION; DECONVOLUTION MAXIMUM ENTROPY METHOD; DECONVOLUTIONS; DOPED ZNO; HIGH-ANGLE ANNULAR DARK FIELD-SCANNING TRANSMISSION ELECTRON MICROSCOPY; HIGH-ANGLE ANNULAR DARK FIELDS; IMAGES PROCESSING; MAXIMUM-ENTROPY METHODS; SB2O3-DOPED ZNO;

ANTIMONY COMPOUNDS;

EID: 0036999175     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/51.6.383     Document Type: Article

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