Technology migration technique for designs with strong RET-driven layout restrictions

Proceedings of the International Symposium on Physical Design

Volumn , Issue , 2005, Pages 175-182

  Yuan, Xin ^a   McCullen, Kevin W ^a   Heng, Fook Luen ^b   Walker, Robert F ^a   Hibbeler, Jason ^a   Allen, Robert J ^a   Narayan, Rani R ^a  

^a IBM   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

RDR; Restrictive Design Rules; RET driven layout; Technology migration

Indexed keywords

CONSTRAINT THEORY; INTEGER PROGRAMMING; OPTIMIZATION; PROBLEM SOLVING; TECHNOLOGY TRANSFER;

RDR; RESTRICTIVE DESIGN RULES; RET-DRIVEN LAYOUT; TECHNOLOGY MIGRATION;

INTEGRATED CIRCUIT LAYOUT;

EID: 29144525528     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1055137.1055172     Document Type: Conference Paper

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