Passive on-chip components: Trends and challenges for RF applications

Microelectronic Engineering

Volumn 82, Issue 3-4 SPEC. ISS., 2005, Pages 503-513

  Decoutere, S ^a   Carchon, G ^a   Dehan, M ^a   Mercha, A ^a  

^a IMEC   (Belgium)

Author keywords

Passive components RF technology

Indexed keywords

FREQUENCIES; RADIO SYSTEMS; SILICON; TECHNOLOGY TRANSFER;

PASSIVE ON-CHIP COMPONENTS; RF PASSIVE TECHNOLOGY;

MICROPROCESSOR CHIPS;

EID: 28144453979     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2005.07.050     Document Type: Conference Paper

References (44)

1. International Technology Roadmap for Semiconductors, 2003 ed., Radio Frequency and analog/Mixed-Signal Technologies for Wireless Communications.
2. D. Linten, S. Thijs, N. Mahadeva Iyer, P. Wambacq, W. Jeamsaksiri, J. Ramos, A. Mercha, S. Jenei. S. Donnay, S. Decoutere, Proceedings of the ESSCIRC, 2004, p. 291.
3. W. Kuhn, and N. Ibrahim IEEE Trans. Microw. 49 2001 31
4. W. Kuhn, X. He, and M. Mojarradi IEEE Trans. Electron Dev. 51 2004 677
5. X. Sun, G. Carchon, W. De Raedt, Proceedings of the IEEE Radio Frequency Integrated Circuits Symposium, Fort Worth, TX, June 6-11, 2004, pp. 445-448.
6. Y. Koutsoyannopoulos, Y. Papananos, C. Alemanni, S. Bantas, Proceedings of the ESSCIRC'97, Southampton UK, September 1997, pp. 320-323.
7. J.M. Lopez-Villegas, J. Samitier, C. Cane, P. Losantos, and J.B. Ausells IEEE Trans. Microw. 48 2000 76 83
8. C. Detcheverry, W. van Noort, R. Hoofman, L. Tiemeijer, V.H. Nguyen, G. Verheyden, P. Bancken, R. Daamen, R. Havens, Proceedings of the ESSDERC2003, Lissabon, 2003, p. 107.
9. S. Jenei, S. Decoutere, G. Winderickx, H. Struyff, Z. Tokei, I. Vervoort, I. Vos, P. Jaenen, L. Carbonell, B. De Jaeger, R. Donaton, S. Vanhaelemeersch, K. Maex, B. Nauwelaers, Proceedings of the IITC, 2001, p. 107.
10. J. Burghartz, D. Edelstein, K. Jenkins, C. Jahnes, C. Uzoh, E. O'Sullivan, K. Chan, M. Soyuer, P. Roper, S. Cordes, Proceedings of the IEDM, 1996, p. 99.
11. Tung-Sheng Chen, J.D.-S. Deng, Chih-Yuan Lee, and Chin-Hsing Kao IEEE Microw.Wireless Comp Lett. 14 10 2004 466 468
12. K.T. Chan, C.H. Huang, A. Chin, M.F. Li, Dim-Lee Kwong, S.P. McAlister, D.S. Duh, and W.J. Lin IEEE Microw. Wireless Comp. Lett. 13 11 2003 460 462
13. R. Dekker, J.-H. Fock, A. Gakis, C. Jonville, O.M. Kuijken, T.M. Michelsen, P. Mijlemans, H. Phlmann, W. Schnitt, C.E. Timeering, A.M.H. Tobeur, Proceedings of the IEDM, 2003, p. 371.
14. J.-B. Yoon, C.-H. Han, E. Yoon, C.-K. Kim, Proceedings of the IEDM, 1999, p. 753.
15. K.J. Chen, Wai Cheong Hon, Jinwen Zhang, and L.L.W. Leung Electron Dev. Lett. IEEE 25 6 2004 363 365
16. G.W. Dahlmann, E.M. Yeatman, P. Young, I.D. Robertson, and S. Lucyszyn Sensor. Actuator. A 2002 215 220
17. Jun-Bo Yoon, Bon-Kee Kim, Chul-Hi Han, Euisik Yoon, Kwyro Lee, Choong-Ki Kim, IEDM '98 Technical Digest, 1998, pp. 544-547.
18. C. Chua, D. Fork, K. Van Schuylenbergh, and J.-P. Lu J. Microelectromech. Syst. 12 2003 989
19. C. Patrick Yu, S. Simon Wong, Symposium on VLSI Circuits, Kyoto, 1997, p. 85-86.
20. J. Burghartz, Proceedings of the IEDM, 1998, p. 523.
21. G. Carchon, L. Carbonell, S. Jenei, M. Van Hove, S. Decoutere, W. De Raedt, K. Maex, E. Beyne, Proceedings of the ESSDERC 2003, Lissabon, 2003, p. 103.
22. J. Rogers, L. Tan, T. Smy, N. Tait, G. Tarr, Proceedings of the IITC, 1999, p. 239.
23. K. Kamogawa, K. Nishikawa, T. Tokimitsu, M. Tanaka, Proceedings of the IEEE RFIC Symposium, 1999, p. 185.
24. K. Saito, T. Kosugi, S. Yagi, C. Yamaguchi, K. Kudo, M. Yano, T. Kumazaki, M. Yaita, H. Ishii, K. Machida, H. Kyuragi, Proceedings of the IEEE IITC, 2000, p. 123.
25. D. Linten, X. Sun, G. Carchon, W. Jeamsaksiri, A. Mercha, J. Ramos, S. Jenei, L. Aspemyr, A. Scholten, P. Wambacq, S. Decoutere, S. Donnay, W. De Raedt, Proceedings of the CICC, 2004.
26. H. Yoshida, H. Suzuki, Y. Kinoshita, H. Fujii, T. Yamazaki, Proceedings of the IEDM, 1998, p. 213-216.
27. H. Erzgraber, T. Grabolla, H. Richter, P. Schley, A. Wolff, Proceedings of the IEDM, 1998, p. 535.
28. J. Kim, J.-O. Plouchart, N. Zamdmer, N. Fong, L.-H. Lu. Y. Tan, K. Jenkins, M. Sherony, R. Groves, M. Kumar, A. Ray, Proceedings of the RFIC Symposium, 2003, p. 591-594.
29. H. Feng, G. Jelodin, K. Gong, R. Zhan, Q. Wu, C. Chen, A. Wang, Proceedings of the RFIC Symposium, 2002, p. 443-446.
30. V. Malba, D. Young, J. Ou, A., Bernhardt, B. Boser, Proceedings of the 48th IEEE Electronic Components and Technology Conference, 1998, p. 252-255.
31. A. Crawford, D. Gardner, and S. Wang IEEE Trans. Magnet. 38 2002 3168 3170
32. A. Crawford, and S. Wang IEEE Trans. On Magnetics 40 2004 2017 2019
33. S. Van Huylenbroeck, S. Decoutere, R. Venegas, S. Jenei, and G. Winderickx IEEE Electron. Dev. Lett. 23 2002 191 193
34. R. Mahnkopf, et al., Proceedings of the IEDM, 1999, p. 849-852.
35. P. Zucher, P. Alluri, P. Chu, A. Duvallet, C. Happ, R. Henderson, J. Mendonca, M. Kim, M. Patras, M. Raymond, T. Remmel, D. Roberts, B. Steimie, J. Stipanuk, S. Straub, T. Sparks, M. Tarabbia, H. thibierozoz, M. Miller, Proceedings of the IEDM, 2000, p. 153-156.
36. M. Armacost, A. Augustin, P. Felsner, Y. Feng, G. Friese, J. Heidenreich, G. Hueckel, O. Prigge, K. Stein, Proceedings of the IEDM, 2000, p. 157-160.
37. T. Ishikawa, D. Kodama, Y. Matsui, M. Hiratani, T. Furusawa and D. Hisamoto, Proceedings of the IEDM, 2002, p. 940-943.
38. C. Ng, C. Ho, N. Toledo, and S. Chu IEEE Electron. Dev. Lett. 25 2004 489 491
39. S. Kim, B. Cho, M. Li, S. Ding, M. Yu, X. Zhu, A. Chin, D. Kwong, Proceedings of the Symposium on VLSI Technology, 2004, p. 218-219.
40. Y.-K. J, S.-J. Won, D.-J. Kwon, M.-W. Song, W.-H. Kim, M.-H. Park, J.-H. Jeong, H.-S. Oh, H.-K. Kang, K.-P. Suh, Proceedings of the Symposium on VLSI Technology, 2004, p. 222-223.
41. B. Motlagh, S. Gevorgian, H. Zirath, Proceedings of the 34th European Microwave Conference, 2004, p. 705-708.
42. M. Moussavi, Y. Gobil, L. Ulmer, L. Perroud, P. Motte, J. Torres, F. Romagna, M. Favolle, J. Palleau, M. Plissonier, Proceedings of the IEEE IITC, 1998, p. 295-297.
43. T. Remmel, R. Ramprasad, J. Walls, Proceedings of the 41st International Reliability Physics Symposium, 2003, p. 277-281.
44. C. Pai, M. Bude, M. Frei, S. Rogers, D. Jacobson, S. Merchant, F. Hui, R. Liu, R. Gregor, Proceedings of the IEEE IITC, 2001, p. 216-218.