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Volumn 8, Issue 12, 2005, Pages
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Structurally and electrically uniform deposition of high-k TiO2thin films on a Ru electrode in three-dimensional contact holes using atomic layer deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
ELECTRODES;
PERMITTIVITY;
RUTHENIUM;
THIN FILMS;
ATOMIC-LAYER-DEPOSITED (ALD);
CONTACT HOLE;
TITANIUM DIOXIDE;
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EID: 28044464256
PISSN: 10990062
EISSN: None
Source Type: Journal
DOI: 10.1149/1.2081994 Document Type: Article |
Times cited : (40)
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References (12)
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