RFCMOS ESD protection and reliability

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2005, Pages 59-66

  Natarajan, M I ^a   Linten, D ^b   Thijs, S ^a   Jansen, Ph ^a   Tremouilles D ^a   Jeamsaksiri, W ^a   Nakaie, T ^c   Sawada, M ^c   Hasebe, T ^c   Decoutere, S ^a   Groeseneken, G ^d  

^a IMEC   (Belgium)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

^c Hanwa Electronics Ind Co Ltd   (Japan)

^d UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28044445629     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)

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