ESD reliability issues in RF CMOS circuits

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4746 I, Issue , 2002, Pages 551-556

  Radhakrishnan, M K ^a   Vassilev, V ^a   Keppens, B ^a   De Heyn, V ^a   Natarajan, M ^a   Groeseneken, G ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC LOADS; ELECTROSTATICS; INTEGRATED CIRCUIT LAYOUT; RELIABILITY;

ELECTROSTATIC DISCHARGES; LOW NOISE AMPLIFIERS; SERIES RESISTANCE; STRINGENT LOAD LIMITATION;

CMOS INTEGRATED CIRCUITS;

EID: 0036407891     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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