Is the power-law model applicable beyond the direct tunneling regime?

Microelectronics Reliability

Volumn 45, Issue 12, 2005, Pages 1861-1867

  Duschl, Rainer ^a   Vollertsen, Rolf Peter ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION MEASUREMENT; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; POWER ELECTRONICS; THRESHOLD ELEMENTS;

POWER-LAW MODELS; TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB); VOLTAGE ACCELERATION;

ELECTRON TUNNELING;

EID: 27744537040     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.03.010     Document Type: Article

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