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Volumn 595, Issue 1-3, 2005, Pages 107-114
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Structure of Co deposited 6H-SiC(0 0 0 1)
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Author keywords
Cobalt silicides; LEED; SiC
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Indexed keywords
ANNEALING;
COBALT;
LOW ENERGY ELECTRON DIFFRACTION;
SCANNING TUNNELING MICROSCOPY;
STRUCTURE (COMPOSITION);
X RAY PHOTOELECTRON SPECTROSCOPY;
ANNEALING TEMPERATURE;
COBALT SILICIDES;
SIC SUBSTRATES;
SUPERSTRUCTURE;
SILICON CARBIDE;
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EID: 27644531493
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.08.005 Document Type: Article |
Times cited : (12)
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References (28)
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