Formation of cobalt disilicide films on (3×3)6H-SiC(0001)

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 11, 2001, Pages

  Platow, W ^a   Wood, D K ^a   Tracy, K M ^a   Burnette, J E ^a   Nemanich, R J ^a   Sayers, D E ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; SILICON DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; FILM; FOURIER TRANSFORMATION; METHODOLOGY; MORPHOLOGY; PHYSICS; SPECTROSCOPY; STRUCTURE ANALYSIS; SYNTHESIS; X RAY ANALYSIS;

EID: 0034900275     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.115312     Document Type: Article

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