Self-assembly of Si nanoclusters on 6H-SiC(0001)-(3×3) reconstructed surface

Applied Physics Letters

Volumn 80, Issue 18, 2002, Pages 3406-3408

  Ong, W J ^a   Tok, E S ^a   Xu, H ^a   Wee, A T S ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELEVATED TEMPERATURE; NANOSTRUCTURE FORMATION; RECONSTRUCTED SURFACES; SCANNING TUNNELING MICROSCOPY (STM); SI NANOCLUSTER; SURFACE RESTRUCTURING; UNIT CELLS; XPS DATA;

NANOCLUSTERS; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

SILICON;

EID: 79956058859     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1476398     Document Type: Article

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