The π/2 Side-Reflection Laue Technique and the New Chart

Journal of Applied Crystallography

Volumn 30, Issue 4, 1997, Pages 456-460

  Park, Young Han ^a   Yeom, Hyo Young ^a   Yoon, Hyung Guen ^a   Kim, Kwang Woo ^b  

^a Dankook University   (South Korea)

^b POSTECH   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0642332151     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897000721     Document Type: Article

References (26)

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