Impact of ultra thin oxide breakdown on circuits

2005 International Conference on Integrated Circuit Design and Technology, ICICDT

Volumn , Issue , 2005, Pages 123-127

  Stathis, James H ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 25844461390     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icicdt.2005.1502607     Document Type: Conference Paper

References (23)

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