Direct measurement of the absolute value of the interaction force between the fiber probe and the sample in a scanning near-field optical microscope

Applied Physics Letters

Volumn 81, Issue 8, 2002, Pages 1503-1505

  Lapshin, D A ^a   Letokhov, V S ^a   Shubeita, G T ^b   Sekatskii, S K ^b   Dietler, G ^b  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

^b UNIVERSITY OF LAUSANNE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE VALUES; AMBIENT CONDITIONS; ATOMIC FORCE MICROSCOPES; ATTRACTION FORCE; DETECTION SCHEME; DIRECT MEASUREMENT; FIBER PROBE; INTERACTION FORCES; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SHEAR FORCE;

ATOMIC FORCE MICROSCOPY; PROBES;

MICROSCOPES;

EID: 79956043062     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1499736     Document Type: Article

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