Combining AFM and FRET for high resolution fluorescence microscopy

Journal of Microscopy

Volumn 202, Issue 2, 2001, Pages 408-412

  Vickery, S A ^a   Dunn, R C ^a  

^a UNIVERSITY OF KANSAS   (United States)

Author keywords

Atomic force microscopy; Fluorescence resonance energy transfer; Near field scanning optical microscopy

Indexed keywords

ENERGY TRANSFER; FLUORESCENCE IMAGING; FLUORESCENCE MICROSCOPY; FORSTER RESONANCE ENERGY TRANSFER; NANOPROBES; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ATOMIC FORCE MICROSCOPY TIPS; ATOMIC-FORCE-MICROSCOPY; DONOR-ACCEPTOR PROPERTIES; ENERGY-TRANSFER; FAR-FIELD; FLUORESCENCE RESONANCE ENERGY TRANSFER; HIGH RESOLUTION; MICROSCOPIC METHODS; NEARFIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DIMENSIONS;

ATOMIC FORCE MICROSCOPY;

DYE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ENERGY TRANSFER; FLUORESCENCE; IMAGE ANALYSIS; IMAGING SYSTEM; MOLECULAR INTERACTION; PRIORITY JOURNAL;

EID: 0035060416     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00857.x     Document Type: Article

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