Scattering-type near-field optical microscopy

Journal of Electron Microscopy

Volumn 53, Issue 2, 2004, Pages 187-192

  Keilmann, Fritz ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

Infrared radiation; Nanostructures; Photon confinement; Scanning near field optical microscopy; Solid scattering tips; Visible light

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT SCATTERING; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE;

ATOMIC-FORCE-MICROSCOPY; INFRARED LIGHT; MATERIALS CHARACTERIZATION; NANOSCALE MATERIAL; OPTICAL-; PHOTON CONFINEMENT; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCATTERING-TYPE NEAR-FIELD OPTICAL MICROSCOPY; SOLID SCATTERING TIP; VISIBLE LIGHT;

INFRARED RADIATION;

EID: 2442596026     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/53.2.187     Document Type: Conference Paper

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