Effect of multi-coating process on the orientation and microstructure of lead zirconate titanate (PZT) thin films derived by chemical solution deposition

Thin Solid Films

Volumn 489, Issue 1-2, 2005, Pages 74-78

  Kobayashi, T ^a   Ichiki, M ^a   Tsaur, J ^a   Maeda, R ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Chemical deposition; Ferroelectric properties; Lead zirconate titanate; X ray diffraction

Indexed keywords

COATINGS; CRYSTALLIZATION; LEAD COMPOUNDS; MICROSTRUCTURE; POLARIZATION; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; THICK FILMS; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM COMPOUNDS;

CHEMICAL DEPOSITION; ELECTRICAL MEASUREMENT; FERROELECTRIC PROPERTIES; LEAD ZIRCONATE TITANATE;

THIN FILMS;

EID: 23144432384     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.05.004     Document Type: Article

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