Evaluation of Pb(Zr, Ti)O3 films derived from propylene-glycol-based sol-gel solutions

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 9 B, 2000, Pages 5421-5425

  Maki, Kazunari ^a   Soyama, Nobuyuki ^a   Mori, Satoru ^a   Ogi, Katsumi ^a  

^a MITSUBISHI MATERIALS CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CURRENT DENSITY; FERROELECTRICITY; GLYCOLS; LEAD COMPOUNDS; LEAKAGE CURRENTS; PROPYLENE; SOL-GELS; THICKNESS MEASUREMENT;

LEAD ZISCONATE TITANATES; MULTICOATED FILMS;

FERROELECTRIC THIN FILMS;

EID: 0034262756     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5421     Document Type: Article

References (15)

1. R. W. Schwartz: Chem. Mater. 9 (1997) 2325.
2. K. D. Budd, S. K. Dey and D. A. Payne: Proc. Br. Ceram. Soc. 36 (1985) 107.
3. T. Atsuki, N. Soyama, G. Sasaki, T. Yonezawa, K. Ogi, K. Sameshima, K. Hoshiba, Y. Nakao and A. Kamisawa: Jpn. J. Appl. Phys. 33 (1994) 5196.
4. K. Maki, N. Soyama, S. Mori, K. Kageyama, M. Matsuura and K. Ogi: Proc. 9th US-Japan Seminar on Dielectric and Piezoelectric Ceramics (1999) p. 203.
5. N. Soyama, K. Maki, S. Mori and K. Ogi: to be published in Integr. Ferroelectr. (2000).
6. N. Hanajima, S. Tsutsumi, T. Yonezawa, K. Hashimoto, R. Nanjo and M. Yamaguchi: Jpn. J. Appl. Phys. 36 (1997) 6069.
7. G. Yi, Z. Wu and M. Sayer: J. Appl. Phys. 64 (1988) 2717.
8. R. W. Schwartz, B. C. Bunker, D. B. Dimos, R. A. Assink, B. A. Tuttle, D. R. Tallant and I. A. Weinstock: Proc. 3rd Int. Symp. Integr. Ferroelectr. (1991) p. 535.
9. T. Olding, B. Leclerc and M. Sayer: Integr. Ferroelectr. 26 (1999) 225.
10. Y. L. Tu and S. J. Milne: J. Mater. Sci. 30 (1995) 2507.
11. R. Kurchania and S. J. Milne: J. Mater. Sci. 33 (1998) 659.
12. Y. L. Tu, M. L. Calzada, N. J. Phillips and S. J. Milne: J. Am. Ceram. Soc. 79 (1996) 441.
13. K. Maki, N. Soyama, S. Mori and K. Ogi: to be published in Integr. Ferroelectr. (2000).
14. H. Doi, T. Atsuki, N. Soyama, G. Sasaki, T. Yonezawa and K. Ogi: Jpn. J. Appl. Phys. 33 (1994) 5159.
15. S. A. Myers and L. N. Chapin: Proc. Mater. Res Soc. Symp. 200 (1990) 231.