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Volumn 281, Issue 2-4, 2005, Pages 290-296

InAs quantum dots grown on InGaAs buffer layers by metal-organic chemical vapor deposition

Author keywords

A1. Characterization; A1. Defects; A1. Nanostructures; A3. Metal organic vapor phase epitaxy; B2. Semiconducting III V materials

Indexed keywords

CHARACTERIZATION; DEFECTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 22144484886     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.04.043     Document Type: Article
Times cited : (6)

References (16)
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    • Evaluation of strained InGaAs/GaAs quantum wells by atomic force microscopy
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.