Evaluation of strained InGaAs/GaAs quantum wells by atomic force microscopy

Applied Physics Letters

Volumn 70, Issue 9, 1997, Pages 1134-1136

  Sato, M ^a,b   Zeimer, U ^a   Bugge, F ^a   Gramlich, S ^a   Weyers, M ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

^b Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009125805     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118507     Document Type: Review

References (11)

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