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Volumn 42, Issue 7 B, 2003, Pages 4777-4779

Scanning probes as the gateway to nanotechnology

Author keywords

Microscopy; Nanostructures; Nanotechnology; Probes; Surfaces

Indexed keywords

MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; PROBES; SURFACES;

EID: 0141792502     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4777     Document Type: Article
Times cited : (13)

References (33)
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    • 12444254324 scopus 로고    scopus 로고
    • private communication
    • D. Awschalom: private communication.
    • Awschalom, D.1
  • 33
    • 12444303656 scopus 로고    scopus 로고
    • private communication
    • H. Rohrer: private communication.
    • Rohrer, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.