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Volumn 86, Issue 17, 2005, Pages 1-3

Surface-charge lithography for GaN microstructuring based on photoelectrochemical etching techniques

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTROCHEMISTRY; ETCHING; GALLIUM NITRIDE; LIGHT EMITTING DIODES; MICROSTRUCTURE; PHOTOCHEMICAL REACTIONS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR LASERS; SEMICONDUCTOR MATERIALS;

EID: 20844446124     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1919393     Document Type: Article
Times cited : (31)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.