Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves

Review of Scientific Instruments

Volumn 70, Issue 6, 1999, Pages 2783-2792

  Tabib Azar, M ^a   Pathak, P S ^a   Ponchak, G ^b   LeClair, S ^c  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

^b NASA GLENN RESEARCH CENTER   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; MAGNETIC MATERIALS; METALLIC MATRIX COMPOSITES; MICROSTRIP DEVICES; MICROWAVES; NONDESTRUCTIVE EXAMINATION; PLANTS (BOTANY); RESONATORS; SEMICONDUCTOR MATERIALS; WAVEGUIDES;

HIGH FREQUENCY EVANESCENT MICROWAVE PROBES;

IMAGING TECHNIQUES;

EID: 0032607216     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149795     Document Type: Article

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