Influence of the gate dielectric on the morphological and electronic structure of pentacene films for transistor applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4466, Issue , 2001, Pages 8-19

  Knipp, D ^a   Street, R A ^a   Krusor, B ^a   Apte, R B ^a   Ho, J ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

Dielectrics; Pentacene; Small molecules; TFT; Thin film transistor

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DIELECTRIC MATERIALS; ELECTRONIC STRUCTURE; GATES (TRANSISTOR); MORPHOLOGY; POLYCRYSTALLINE MATERIALS; THRESHOLD VOLTAGE; X RAY DIFFRACTION;

PENTACENE FILMS;

THIN FILM TRANSISTORS;

EID: 0035767505     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451473     Document Type: Conference Paper

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