-
1
-
-
0032109136
-
-
O. Auciello, J. F. Scott, R. Ramesh, Phys. Today 1998, 51 (7), 22.
-
(1998)
Phys. Today
, vol.51
, Issue.7
, pp. 22
-
-
Auciello, O.1
Scott, J.F.2
Ramesh, R.3
-
2
-
-
0037179387
-
-
T. Tybell, P. Paruch, T. Giamarchi, J.-M. Triscone, Phys. Rev. Lett. 2002, 89, 097 601.
-
(2002)
Phys. Rev. Lett.
, vol.89
, pp. 097601
-
-
Tybell, T.1
Paruch, P.2
Giamarchi, T.3
Triscone, J.-M.4
-
3
-
-
0000198768
-
-
B. Jiang, J. L. Peng, L. A. Bursill, W. L. Zhong, J. Appl. Phys. 2000, 87, 3462.
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 3462
-
-
Jiang, B.1
Peng, J.L.2
Bursill, L.A.3
Zhong, W.L.4
-
4
-
-
0000262148
-
-
W. L. Zhong, Y. G. Wang, P. L. Zang, B. D. Qu, Phys. Rev. B: Condens. Matter Mater. Phys. 1994, 50, 698.
-
(1994)
Phys. Rev. B: Condens. Matter Mater. Phys.
, vol.50
, pp. 698
-
-
Zhong, W.L.1
Wang, Y.G.2
Zang, P.L.3
Qu, B.D.4
-
6
-
-
0001453101
-
-
C. S. Ganpule, A. Stanishevsky, S. Aggarwal, J. Melngailis, E. Williams, R. Ramesh, Appl. Phys. Lett. 1999, 75, 3874.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 3874
-
-
Ganpule, C.S.1
Stanishevsky, A.2
Aggarwal, S.3
Melngailis, J.4
Williams, E.5
Ramesh, R.6
-
7
-
-
0035832888
-
-
M. Alexe, C. Harnagea, D. Hesse, U. Gösele, Appl. Phys. Lett. 2001, 79, 242.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 242
-
-
Alexe, M.1
Harnagea, C.2
Hesse, D.3
Gösele, U.4
-
8
-
-
79958241557
-
-
S. Bühlmann, B. Dwir, J. Baborowski, P. Muralt, Appl. Phys. Lett. 2002, 50, 3195.
-
(2002)
Appl. Phys. Lett.
, vol.50
, pp. 3195
-
-
Bühlmann, S.1
Dwir, B.2
Baborowski, J.3
Muralt, P.4
-
9
-
-
0942273373
-
-
H. Fujisawa, K. Morimoto, M. Shimizu, H. Niu, K. Honda, S. Ohtani, Mater. Res. Soc. Symp. Proc. 2001, 655, CC10.4.1.
-
(2001)
Mater. Res. Soc. Symp. Proc.
, vol.655
-
-
Fujisawa, H.1
Morimoto, K.2
Shimizu, M.3
Niu, H.4
Honda, K.5
Ohtani, S.6
-
11
-
-
0002998680
-
-
R. Waser, T. Schneller, S. Hoffmann-Eifert, P. Ehrhart, Integr. Ferroelectr. 2001, 36, 3.
-
(2001)
Integr. Ferroelectr.
, vol.36
, pp. 3
-
-
Waser, R.1
Schneller, T.2
Hoffmann-Eifert, S.3
Ehrhart, P.4
-
12
-
-
2942559048
-
-
R. W. Schwartz, T. Schneller, R. Waser, C. R. Chimie 2004, 7, 433.
-
(2004)
C. R. Chimie
, vol.7
, pp. 433
-
-
Schwartz, R.W.1
Schneller, T.2
Waser, R.3
-
13
-
-
0030164635
-
-
A. Seifert, A. Vojta, J. S. Speck, F. F. Lange, J. Mater. Res. 1996, 11, 1470.
-
(1996)
J. Mater. Res.
, vol.11
, pp. 1470
-
-
Seifert, A.1
Vojta, A.2
Speck, J.S.3
Lange, F.F.4
-
14
-
-
0348087028
-
-
A. Roelofs, T. Schneller, K. Szot, R. Waser, Appl. Phys. Lett. 2002, 81, 5231.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 5231
-
-
Roelofs, A.1
Schneller, T.2
Szot, K.3
Waser, R.4
-
15
-
-
16244420787
-
-
A. Rüdiger, T. Schneller, A. Roelofs, S. Tiedke, T. Schmilz, R. Waser, Appl. Phys. A: Mater. Sci. Process 2005, 80, 1247.
-
(2005)
Appl. Phys. A: Mater. Sci. Process
, vol.80
, pp. 1247
-
-
Rüdiger, A.1
Schneller, T.2
Roelofs, A.3
Tiedke, S.4
Schmilz, T.5
Waser, R.6
-
16
-
-
0345283362
-
-
M. Dawber, I. Szafraniak, M. Alexe, J. F. Scott, J. Phys.: Condens. Matter 2003, 15, L667.
-
(2003)
J. Phys.: Condens. Matter
, vol.15
-
-
Dawber, M.1
Szafraniak, I.2
Alexe, M.3
Scott, J.F.4
-
18
-
-
0001143028
-
-
P. Muralt, T. Maeder, L. Sagalowicz, S. Hiboux, J. Appl. Phys. 1998, 83, 3835.
-
(1998)
J. Appl. Phys.
, vol.83
, pp. 3835
-
-
Muralt, P.1
Maeder, T.2
Sagalowicz, L.3
Hiboux, S.4
-
19
-
-
0034217365
-
-
R. Bouregba, G. Poullain, B. Vilquin, H. Murray, Mater. Res. Bull. 2000, 55, 1381.
-
(2000)
Mater. Res. Bull.
, vol.55
, pp. 1381
-
-
Bouregba, R.1
Poullain, G.2
Vilquin, B.3
Murray, H.4
-
20
-
-
2342475751
-
-
S. Bühlmann, P. Muralt, S. Von Allmen, Appl. Phys. Lett. 2004, 84, 2614.
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 2614
-
-
Bühlmann, S.1
Muralt, P.2
Von Allmen, S.3
-
21
-
-
0001331485
-
-
A. Beck, J. G. Bednorz, Ch. Gerber, C. Rossel, D. Widmer, Appl. Phys. Lett. 2000, 77, 139.
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 139
-
-
Beck, A.1
Bednorz, J.G.2
Gerber, Ch.3
Rossel, C.4
Widmer, D.5
-
23
-
-
20444506200
-
-
note
-
x) due to contact with oxygen from the environment, especially because of the small layer thickness.
-
-
-
-
24
-
-
0042541468
-
-
R. Nouwen, J. Mullens, D. Franco, J. Yperman, L. C. Van Poucke, Vib. Spectrosc. 1996, 10, 291.
-
(1996)
Vib. Spectrosc.
, vol.10
, pp. 291
-
-
Nouwen, R.1
Mullens, J.2
Franco, D.3
Yperman, J.4
Van Poucke, L.C.5
-
25
-
-
0032592315
-
-
D. J. Wouters, G. J. Norga, H. E. Maes, Mater. Res. Soc. Symp. Proc. 1999, 541, 381.
-
(1999)
Mater. Res. Soc. Symp. Proc.
, vol.541
, pp. 381
-
-
Wouters, D.J.1
Norga, G.J.2
Maes, H.E.3
-
26
-
-
0142026366
-
-
I. Szafraniak, C. Harnagea, R. Scholz, S. Bhattacharyya, D. Hesse, M. Alexe, Appl. Phys. Lett. 2003, 83, 2211.
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 2211
-
-
Szafraniak, I.1
Harnagea, C.2
Scholz, R.3
Bhattacharyya, S.4
Hesse, D.5
Alexe, M.6
-
27
-
-
20444445657
-
-
Supplied by Allresist (Strausberg, Germany)
-
Supplied by Allresist (Strausberg, Germany).
-
-
-
|