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Volumn 11, Issue 6, 1996, Pages 1470-1481

Microstructural instability in single-crystal thin films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATING TECHNIQUES; CRYSTAL MICROSTRUCTURE; EPITAXIAL GROWTH; HEAT TREATMENT; INTERFACIAL ENERGY; LEAD COMPOUNDS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; STABILITY; STRONTIUM COMPOUNDS; THIN FILMS;

EID: 0030164635     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.1996.0183     Document Type: Article
Times cited : (100)

References (19)
  • 13
  • 18
    • 0038770015 scopus 로고
    • edited by M. Fuentes and J. G. Sevillano Trans. Tech. Publications, Brooksfield, VT
    • F. F. Lange, in Proc. Recrystallization '92, edited by M. Fuentes and J. G. Sevillano (Trans. Tech. Publications, Brooksfield, VT, 1992), p. 81.
    • (1992) Proc. Recrystallization '92 , pp. 81
    • Lange, F.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.