AFM force measurements between SAM-modified tip and SAM-modified substrate in alkaline solution

Journal of Physical Chemistry B

Volumn 109, Issue 20, 2005, Pages 10213-10222

  Kwon, Han Cheol ^a   Gewirth, Andrew A ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION PEAK; ALKALINE SOLUTIONS; FORCE CURVES; FORCE MEASUREMENTS;

ADHESION; ADSORPTION; CHEMICAL MODIFICATION; CYCLIC VOLTAMMETRY; DESORPTION; GOLD; SELF ASSEMBLY; SOLUTIONS;

ATOMIC FORCE MICROSCOPY;

ALKALI; ETHANETHIOL; HEXADECANETHIOL; THIOL DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; METHODOLOGY; SOLUTION AND SOLUBILITY;

ALKALIES; MICROSCOPY, ATOMIC FORCE; SOLUTIONS; SULFHYDRYL COMPOUNDS;

EID: 20344394184     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp044655o     Document Type: Article

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