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Volumn 106, Issue 40, 2002, Pages 10440-10446
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Measurement of double-layer forces at the polymer film/electrolyte interfaces using atomic force microscopy: Concentration and potential-dependent interactions
a,b c a |
Author keywords
[No Author keywords available]
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Indexed keywords
CONDUCTIVE FILMS;
ELECTRIC CHARGE;
ELECTRIC POTENTIAL;
ELECTRODES;
ELECTROLYTES;
ION EXCHANGE MEMBRANES;
NEGATIVE IONS;
PHASE INTERFACES;
SOLUTIONS;
REPULSIVE FORCES;
PLASTIC FILMS;
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EID: 0037058084
PISSN: 10895647
EISSN: None
Source Type: Journal
DOI: 10.1021/jp026350k Document Type: Article |
Times cited : (18)
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References (42)
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