Observation of element-specific energy-filtered X-ray photoemission electron microscopy images of Au on Ta using a wien filter type energy analyzer

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 11 A, 2004, Pages 7682-7688

  Yasufuku, Hideyuki ^a,b   Ohminami, Yusuke ^a   Tsutsumi, Tetsuya ^a   Niimi, Hironobu ^a   Matsudaira, Nobuaki ^a   Asakura, Kiyotaka ^a   Kato, Makoto ^c   Sakai, Yuji ^c   Kitajima, Yoshinori ^d   Iwasawa, Yasuhiro ^e  

^a HOKKAIDO UNIVERSITY   (Japan)

^b National Institute for Materials Science   (Japan)

^c JEOL LTD   (Japan)

^d National Laboratory for High Energy Physics   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

Author keywords

Au; Energy filtered X ray photoemission electron microscopy; EXPEEM; PEEM; Spectromicroscopy; Surface imaging; Ta; Wien filter; XPEEM; XPS

Indexed keywords

ELECTRON MICROSCOPY; GOLD; KINETIC ENERGY; LIGHT ABSORPTION; PHOTONS; TANTALUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY-FILTERED X-RAY PHOTOEMISSION ELECTRON MICROSCOPY (EXPEEM); PHOTOEMISSION ELECTRON MICROSCOPY (PEEM); SPECTROMICROSCOPY; SURFACE IMAGING; WIEN FILTER; XPEEM;

PHOTOEMISSION;

EID: 19944428711     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.7682     Document Type: Article

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