Fast elemental mapping and magnetic imaging with high lateral resolution using a novel photoemission microscope

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 983-989

  Ziethen, Ch ^a   Schmidt, O ^a   Fecher, G H ^a   Schneider, C M ^a   Schonhense G ^a   Fromter R ^b   Seider, M ^b   Grzelakowski, K ^c   Merkel, M ^c   Funnemann, D ^d   Swiech, W ^e   Gundlach, H ^f   Kirschner, J ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c FOCUS GmbH   (Germany)

^d Omicron Nano Technology GmbH   (Germany)

^e UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^f HAHN MEITNER INSTITUT   (Germany)

Author keywords

Local area XANES; Magnetic domain imaging; Photoemission microscopy; Spectromicroscopy

Indexed keywords

EID: 11244262085     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00265-x     Document Type: Article

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