-
1
-
-
0030400717
-
Low temperature polysilicon materials and devices
-
D. Pribat, P. Legagneux, F. Plais, C. Reita, F. Petinot, and O. Huet, "Low temperature polysilicon materials and devices," in Proc. Mater. Res. Soc., vol. 424, 1997, pp. 127-140.
-
(1997)
Proc. Mater. Res. Soc.
, vol.424
, pp. 127-140
-
-
Pribat, D.1
Legagneux, P.2
Plais, F.3
Reita, C.4
Petinot, F.5
Huet, O.6
-
2
-
-
0029322855
-
Topical review: Polycrystalline silicon thin-film transistors
-
S. D. Brotherton, "Topical review: Polycrystalline silicon thin-film transistors," Semicond. Sci. Technol., vol. 10, pp. 721-738, 1995.
-
(1995)
Semicond. Sci. Technol.
, vol.10
, pp. 721-738
-
-
Brotherton, S.D.1
-
3
-
-
0030101024
-
Crystalline Si films for integrated active-matrix liquid-crystal displays
-
J. S. Im and R. S. Sposili, "Crystalline Si films for integrated active-matrix liquid-crystal displays," MRS Bull., vol. XXI, no. 3, p. 39, 1996.
-
(1996)
MRS Bull.
, vol.21
, Issue.3
, pp. 39
-
-
Im, J.S.1
Sposili, R.S.2
-
4
-
-
36449009173
-
Pd induced lateral crystallization of amorphous Si thin films
-
S.-W. Lee and S.-K. Joo, "Pd induced lateral crystallization of amorphous Si thin films," Appl. Phys. Lett., vol. 66, p. 1671, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 1671
-
-
Lee, S.-W.1
Joo, S.-K.2
-
5
-
-
0001290762
-
Influence of melt depth in laser crystallised poly-Si thin-film transistors
-
S. D. Brotherton, D. J. McCulloch, J. P. Gowers, J. R. Ayres, and M. J. Trainor, "Influence of melt depth in laser crystallised poly-Si thin-film transistors," J. Appl. Phys., vol. 82, no. 8, pp. 4086-4094, 1997.
-
(1997)
J. Appl. Phys.
, vol.82
, Issue.8
, pp. 4086-4094
-
-
Brotherton, S.D.1
McCulloch, D.J.2
Gowers, J.P.3
Ayres, J.R.4
Trainor, M.J.5
-
6
-
-
0012901475
-
Crystallization kinetics of hydrogenated amorphous silicon during pulsed excimer laser annealing
-
S. E. Ready, J. H. Roh, J. B. Boyce, and G. B. Anderson, "Crystallization kinetics of hydrogenated amorphous silicon during pulsed excimer laser annealing," in Proc. Mater. Res. Soc., vol. 258, 1992, p. 111.
-
(1992)
Proc. Mater. Res. Soc.
, vol.258
, pp. 111
-
-
Ready, S.E.1
Roh, J.H.2
Boyce, J.B.3
Anderson, G.B.4
-
7
-
-
0030106305
-
New excimer-laser-crystallization method for producing large-grained and grain-boundary-location-controlled Si films for thin-film transistors
-
H. J. Kim, and J. S. Im, "New excimer-laser-crystallization method for producing large-grained and grain-boundary-location-controlled Si films for thin-film transistors," Appl. Phys. Lett., vol. 68, no. 11, pp. 1513-1515, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, Issue.11
, pp. 1513-1515
-
-
Kim, H.J.1
Im, J.S.2
-
8
-
-
0032045953
-
Controlled super-lateral growth of Si films for microstructural manipulation and optimization
-
J. S. Im, M. A. Crowder, R. S. Sposili, J. P. Leonard, H. J. Kim, J. H. Yoon, V. V. Gupta, H. J. Song, and H. S. Cho, "Controlled super-lateral growth of Si films for microstructural manipulation and optimization," Solid State Phys., vol. 166, pp. 603-617, 1998.
-
(1998)
Solid State Phys.
, vol.166
, pp. 603-617
-
-
Im, J.S.1
Crowder, M.A.2
Sposili, R.S.3
Leonard, J.P.4
Kim, H.J.5
Yoon, J.H.6
Gupta, V.V.7
Song, H.J.8
Cho, H.S.9
-
9
-
-
0000897114
-
2
-
2," Appl. Phys. Lett., vol. 69, no. 19, pp. 2864-2866, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, Issue.19
, pp. 2864-2866
-
-
Sposili, R.S.1
Im, J.S.2
-
10
-
-
0031162501
-
Single crystal Si films for thin-film transistor devices
-
J. S. Im, R. S. Sposili, and M. A. Crowder, "Single crystal Si films for thin-film transistor devices," Appl. Phys. Lett., vol. 70, no. 25, pp. 3434-3436, 1997.
-
(1997)
Appl. Phys. Lett.
, vol.70
, Issue.25
, pp. 3434-3436
-
-
Im, J.S.1
Sposili, R.S.2
Crowder, M.A.3
-
11
-
-
0035782801
-
Characterization of poly-Si TFTs in directionally solidified SLS Si
-
S. D. Brotherton, M. A. Crowder, A. B. Limanov, and J. S. Im, "Characterization of poly-Si TFTs in directionally solidified SLS Si," in Proc. Asia Display/IDW, 2001, p. 387.
-
Proc. Asia Display/IDW, 2001
, pp. 387
-
-
Brotherton, S.D.1
Crowder, M.A.2
Limanov, A.B.3
Im, J.S.4
-
12
-
-
0037416534
-
Parametric investigation of SLS-processed poly-silicon thin films for TFT applications
-
M. A. Crowder, M. Moriguchi, Y. Mitani, and A. T. Voutsas, "Parametric investigation of SLS-processed poly-silicon thin films for TFT applications," Thin Solid Films, vol. 427, pp. 101-107, 2003.
-
(2003)
Thin Solid Films
, vol.427
, pp. 101-107
-
-
Crowder, M.A.1
Moriguchi, M.2
Mitani, Y.3
Voutsas, A.T.4
-
13
-
-
0028409580
-
On the super lateral growth phenomenon observed in excimer laser-induced crystallization of thin Si films
-
J. S. Im and H. J. Kim, "On the super lateral growth phenomenon observed in excimer laser-induced crystallization of thin Si films," Appl. Phys. Lett., vol. 64, no. 17, pp. 2303-2305, 1994.
-
(1994)
Appl. Phys. Lett.
, vol.64
, Issue.17
, pp. 2303-2305
-
-
Im, J.S.1
Kim, H.J.2
-
14
-
-
0032137394
-
Low-temperature single-crystal Si TFTs fabricated on Si films processed via sequential lateral solidification
-
May
-
M. A. Crowder, P. G. Carey, P. M. Smith, R. S. Sposili, H. S. Cho, and J. S. Im, "Low-temperature single-crystal Si TFTs fabricated on Si films processed via sequential lateral solidification," IEEE Electron Device Lett., vol. 19, pp. 306-308, May 1998.
-
(1998)
IEEE Electron Device Lett.
, vol.19
, pp. 306-308
-
-
Crowder, M.A.1
Carey, P.G.2
Smith, P.M.3
Sposili, R.S.4
Cho, H.S.5
Im, J.S.6
-
16
-
-
0034428520
-
Sequential lateral solidification of PECVD and sputter deposited a-Si films
-
M. A. Crowder, R. S. Sposili, A. B. Limanov, and J. S. Im, "Sequential lateral solidification of PECVD and sputter deposited a-Si films," in Proc. Mater. Res. Soc., 2000, vol. 621, p. Q9.7.
-
Proc. Mater. Res. Soc., 2000
, vol.621
-
-
Crowder, M.A.1
Sposili, R.S.2
Limanov, A.B.3
Im, J.S.4
-
17
-
-
0000057012
-
Orientation dependence of high speed crystal growth from the melt
-
A. G. Cullis, N. G. Chew, H. C. Webber, and D. J. Smith, "Orientation dependence of high speed crystal growth from the melt," J. Cryst. Growth, vol. 68, pp. 624-638, 1984.
-
(1984)
J. Cryst. Growth
, vol.68
, pp. 624-638
-
-
Cullis, A.G.1
Chew, N.G.2
Webber, H.C.3
Smith, D.J.4
-
18
-
-
0029746135
-
Optimization and transformation analysis of grain-boundary-location-controlled Si films
-
H. J. Kim and J. S. Im, "Optimization and transformation analysis of grain-boundary-location-controlled Si films," in Proc. Mater. Res. Soc., 1996, vol. 397, pp. 401-406.
-
Proc. Mater. Res. Soc., 1996
, vol.397
, pp. 401-406
-
-
Kim, H.J.1
Im, J.S.2
-
19
-
-
0034428445
-
Sequential lateral solidification of ultra-thin a-Si films
-
H. S. Cho, D.-B. Kim, A. B. Limanov, M. A. Crowder, and J. S. Im, "Sequential lateral solidification of ultra-thin a-Si films," in Proc. Mater. Res. Soc., 2000, vol. 621, p. Q9.9.
-
Proc. Mater. Res. Soc., 2000
, vol.621
-
-
Cho, H.S.1
Kim, D.-B.2
Limanov, A.B.3
Crowder, M.A.4
Im, J.S.5
-
20
-
-
0034429921
-
Sub-grain boundary spacing in directionally crystallized Si films obtained via sequential lateral solidification
-
M. A. Crowder, A. B. Limanov, and J. S. Im, "Sub-grain boundary spacing in directionally crystallized Si films obtained via sequential lateral solidification," in Proc. Mater. Res. Soc., 2000. vol. 621, p. Q9.6.
-
Proc. Mater. Res. Soc., 2000
, vol.621
-
-
Crowder, M.A.1
Limanov, A.B.2
Im, J.S.3
-
21
-
-
34249915301
-
Characterization & analysis of sub-grain boundaries in sequential lateral solidification processed SOI films
-
M. A. Crowder, A. B. Limanov, B. A. Turk, and J. S. Im, "Characterization & analysis of sub-grain boundaries in sequential lateral solidification processed SOI films," Proc. Mater. Res. Soc., 2001.
-
Proc. Mater. Res. Soc., 2001
-
-
Crowder, M.A.1
Limanov, A.B.2
Turk, B.A.3
Im, J.S.4
-
23
-
-
0020089602
-
Conductivity behavior in polycrystalline semiconductor thin-film transistors
-
Feb.
-
J. Levinson, F. Shepherd, P. Scanlon, W. Westwood, G. Este, and M. Rider, "Conductivity behavior in polycrystalline semiconductor thin-film transistors," J. Appl. Phys., vol. 53, no. 2, pp. 1193-202, Feb. 1982.
-
(1982)
J. Appl. Phys.
, vol.53
, Issue.2
, pp. 1193-1202
-
-
Levinson, J.1
Shepherd, F.2
Scanlon, P.3
Westwood, W.4
Este, G.5
Rider, M.6
-
24
-
-
36549099157
-
Effects of the presence/absence of HCL during gate oxidation on the electrical and structural properties of polycrystalline silicon thin-film transistors
-
R. E. Proano and D. G. Ast, "Effects of the presence/absence of HCL during gate oxidation on the electrical and structural properties of polycrystalline silicon thin-film transistors," J. Appl. Phys., vol. 66, no. 5, pp. 2189-99, 1989.
-
(1989)
J. Appl. Phys.
, vol.66
, Issue.5
, pp. 2189-2199
-
-
Proano, R.E.1
Ast, D.G.2
-
25
-
-
0033079499
-
Effect of multiple scans and granular defects on excimer laser annealed polysilicon TFTs
-
Feb.
-
A. M. Marmorstein, A. T. Voutsas, and R. Solanki, "Effect of multiple scans and granular defects on excimer laser annealed polysilicon TFTs," Solid State Electron., vol. 43, no. 2, pp. 305-13, Feb. 1999.
-
(1999)
Solid State Electron.
, vol.43
, Issue.2
, pp. 305-313
-
-
Marmorstein, A.M.1
Voutsas, A.T.2
Solanki, R.3
|