Influence of melt depth in laser crystallized poly-Si thin film transistors

Journal of Applied Physics

Volumn 82, Issue 8, 1997, Pages 4086-4094

  Brotherton, S D ^a   McCulloch, D J ^a   Gowers, J P ^a   Ayres, J R ^a   Trainor, M J ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001290762     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365719     Document Type: Article

References (20)

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