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Volumn 92, Issue 8, 2002, Pages 4238-4244

Metalorganic precursor decomposition and oxidation mechanisms in plasma-enhanced ZrO 2 deposition

Author keywords

[No Author keywords available]

Indexed keywords

CHAMBER PRESSURE; CHEMICAL EFFECT; DISSOCIATION ENERGIES; FLOWRATE RATIO; GAS-PHASE REACTIONS; GRADUAL CHANGES; METAL ORGANIC PRECURSORS; MICROWAVE POWER; OXIDATION MECHANISMS; OXIDATION STATE; PHYSICAL EFFECTS; PLASMA ELECTRONS; PROCESS VARIABLES; QUADRUPOLE MASS SPECTROMETRY; REACTION PATHS; STEP CHANGES; TIME EVOLUTIONS; ZIRCONIUM OXIDATION;

EID: 18744386080     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1506421     Document Type: Article
Times cited : (31)

References (21)
  • 6
    • 0027909230 scopus 로고
    • tsf THSFAP 0040-6090
    • E. Kim and S. Yoon, Thin Solid Films 227, 7 (1993). tsf THSFAP 0040-6090
    • (1993) Thin Solid Films , vol.227 , pp. 7
    • Kim, E.1    Yoon, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.