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Optical Materials

Volumn 27, Issue 8, 2005, Pages 1391-1395

Growth and optical characterization of ZnO thin films deposited on sapphire substrate by MOCVD technique

(5) El Yadouni, A a Boudrioua, A a Loulergue, J C a Sallet, Vincent b Triboulet, R a,b

a CNRS (France)

b CNRS Lab Phys Solides de Bellevue (France)

Author keywords

Optical losses; Spectre RX; Thin films; Waveguides; Zinc oxide (ZnO); Raman

Indexed keywords

ANISOTROPY; GROWTH (MATERIALS); LIGHT PROPAGATION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SAPPHIRE; X RAY DIFFRACTION; ZINC OXIDE;

OPTICAL ANISOTROPY; OPTICAL AXIS; OPTICAL LOSSES; SPECTRE RX; Μ-RAMAN;

THIN FILMS;

EID: 17444397736 PISSN: 09253467 EISSN: None Source Type: Journal
DOI: 10.1016/j.optmat.2004.09.024 Document Type: Article

Times cited : (19)

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