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Journal of Crystal Growth

Volumn 223, Issue 1-2, 2001, Pages 201-205

Polycrystalline ZnO thin films on Si (1 0 0) deposited by filtered cathodic vacuum arc

(5) Xu, X L a Lau, S P a Chen, J S a Chen, G Y a Tay, B K a

a NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

FILTERED CATHODIC VACUUM ARCS;

SEMICONDUCTING FILMS;

EID: 0034824148 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(01)00611-X Document Type: Article

Times cited : (225)

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