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Volumn 27, Issue 7, 1998, Pages 876-882

Structural, electrical and optical properties of zinc oxide produced by oxidation of zinc thin films

Author keywords

c axis orientation; Oxidation; Texture; Thin film; Zinc; Zinc oxide

Indexed keywords


EID: 0001063849     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-998-0113-4     Document Type: Article
Times cited : (18)

References (24)
  • 13
    • 0003427458 scopus 로고
    • Menlo Park, CA: Addison-Wesley Publishing, Inc.
    • B.D. Cullity, Elements of X-Ray Diffraction (Menlo Park, CA: Addison-Wesley Publishing, Inc., 1978), p. 284.
    • (1978) Elements of X-Ray Diffraction , pp. 284
    • Cullity, B.D.1
  • 14
    • 0037997768 scopus 로고
    • Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, 1969.
    • (1969) Powder Diffraction File
  • 17
    • 0007048833 scopus 로고
    • ed. R.I. Jaefee and M.S. Seltzen N.Y.: Plenum Press
    • R.H. Condit, Defects and Transport in Oxides, ed. R.I. Jaefee and M.S. Seltzen (N.Y.: Plenum Press, 1973), p. 303.
    • (1973) Defects and Transport in Oxides , pp. 303
    • Condit, R.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.