메뉴 건너뛰기




Volumn 120, Issue 1, 2005, Pages 17-25

SABCMS, a new approach to higher lateral resolution of laser probe measurement system

Author keywords

Binary optical element; Confocal microscope; Laser probe measurement; SABCMS; Superresolution; Surface contour; Ultraprecision measurement

Indexed keywords

BESSEL FUNCTIONS; LASER BEAMS; MEASUREMENT THEORY; MICROSCOPES; MICROSTRUCTURE; OPTICAL MICROSCOPY; PROBES;

EID: 17444374612     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2004.11.002     Document Type: Article
Times cited : (25)

References (22)
  • 1
    • 0020117736 scopus 로고
    • Three-dimensional surface measurement using the confocal scanning microscopy
    • D.K. Hamilton, and T. Wilson Three-dimensional surface measurement using the confocal scanning microscopy Appl. Phys. B 27 1982 211 213
    • (1982) Appl. Phys. B , vol.27 , pp. 211-213
    • Hamilton, D.K.1    Wilson, T.2
  • 2
    • 0000407407 scopus 로고
    • The extend-focus, auto-focus and surface-profiling techniques of confocal microscopy
    • C.J.R. Sheppard, and H.J. Matthews The extend-focus, auto-focus and surface-profiling techniques of confocal microscopy J. Mod. Opt. 35 1988 145 154
    • (1988) J. Mod. Opt. , vol.35 , pp. 145-154
    • Sheppard, C.J.R.1    Matthews, H.J.2
  • 4
    • 1542631741 scopus 로고    scopus 로고
    • Highly accurate non-contact characterization of engineering surfaces using confocal microscopy
    • H.-J. Jordan, M. Wegner, and H. Tiziani Highly accurate non-contact characterization of engineering surfaces using confocal microscopy Meas. Sci. Technol. 9 1998 1142 1151
    • (1998) Meas. Sci. Technol. , vol.9 , pp. 1142-1151
    • Jordan, H.-J.1    Wegner, M.2    Tiziani, H.3
  • 5
    • 0033900897 scopus 로고    scopus 로고
    • Confocal principle for macro- and microscopic surface and defect analysis
    • H.J. Tiziani, M. Wegner, and D. Steudie Confocal principle for macro- and microscopic surface and defect analysis Opt. Eng. 39 2000 32 39
    • (2000) Opt. Eng. , vol.39 , pp. 32-39
    • Tiziani, H.J.1    Wegner, M.2    Steudie, D.3
  • 6
    • 0031079146 scopus 로고    scopus 로고
    • Noninterferometric differential confocal microscopy with 2 nm depth resolution
    • C.H. Lee, and J.P. Wang Noninterferometric differential confocal microscopy with 2 nm depth resolution Opt. Commun. 35 1997 233 237
    • (1997) Opt. Commun. , vol.35 , pp. 233-237
    • Lee, C.H.1    Wang, J.P.2
  • 7
    • 0033726098 scopus 로고    scopus 로고
    • Characterization of surface topography by confocal microscopy. I. Principles and the measurement system
    • G. Udupa, M. Singaperumal, R.S. Sirohi, and M.P. Kothiyal Characterization of surface topography by confocal microscopy. I. Principles and the measurement system Meas. Sci. Technol. 11 2000 305 314
    • (2000) Meas. Sci. Technol. , vol.11 , pp. 305-314
    • Udupa, G.1    Singaperumal, M.2    Sirohi, R.S.3    Kothiyal, M.P.4
  • 8
    • 0033691056 scopus 로고    scopus 로고
    • Characterization of surface topography by confocal microscopy. II. the micro and macro surface irregularities
    • G. Udupa, M. Singaperumal, R.S. Sirohi, and M.P. Kothiyal Characterization of surface topography by confocal microscopy. II. The micro and macro surface irregularities Meas. Sci. Technol. 11 2000 315 329
    • (2000) Meas. Sci. Technol. , vol.11 , pp. 315-329
    • Udupa, G.1    Singaperumal, M.2    Sirohi, R.S.3    Kothiyal, M.P.4
  • 9
    • 0034459232 scopus 로고    scopus 로고
    • The optical probe using confocal technique for surface profile measurement
    • F. Wang, J. Tan, and W. Zhao The optical probe using confocal technique for surface profile measurement Proc. SPIE 4222 2000 194 197
    • (2000) Proc. SPIE , vol.4222 , pp. 194-197
    • Wang, F.1    Tan, J.2    Zhao, W.3
  • 10
    • 0036678876 scopus 로고    scopus 로고
    • Theoretical analysis and property study of optical focus detection based on differential confocal microscopy
    • J. Tan, and F. Wang Theoretical analysis and property study of optical focus detection based on differential confocal microscopy Meas. Sci. Technol. 13 2002 1289 1293
    • (2002) Meas. Sci. Technol. , vol.13 , pp. 1289-1293
    • Tan, J.1    Wang, F.2
  • 11
    • 0037446189 scopus 로고    scopus 로고
    • A small probe with a gradient index lens for confocal measurement
    • J. Tan, and J. Zhang A small probe with a gradient index lens for confocal measurement Sens. Actuators A 104 2003 121 126
    • (2003) Sens. Actuators A , vol.104 , pp. 121-126
    • Tan, J.1    Zhang, J.2
  • 12
    • 0344946465 scopus 로고    scopus 로고
    • Differential confocal optical system using gradient-index lenses
    • J. Tan, and J. Zhang Differential confocal optical system using gradient-index lenses Opt. Eng. 42 2003 2868 2871
    • (2003) Opt. Eng. , vol.42 , pp. 2868-2871
    • Tan, J.1    Zhang, J.2
  • 13
    • 0043136635 scopus 로고    scopus 로고
    • Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection
    • E. Higurashi, R. Sawada, and T. Ito Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection Rev. Sci. Instrum. 70 1999 3068 3073
    • (1999) Rev. Sci. Instrum. , vol.70 , pp. 3068-3073
    • Higurashi, E.1    Sawada, R.2    Ito, T.3
  • 14
    • 0033723276 scopus 로고    scopus 로고
    • The development of a low-cost focusing probe for profile measurement
    • K.C. Fan, C.Y. Lin, and L.H. Shyu The development of a low-cost focusing probe for profile measurement Meas. Sci. Technol. 11 2000 N1 N7
    • (2000) Meas. Sci. Technol. , vol.11
    • Fan, K.C.1    Lin, C.Y.2    Shyu, L.H.3
  • 15
    • 0035500173 scopus 로고    scopus 로고
    • CD-R groove measurement by phase stepping interferometry
    • V. Sainov, and N. Mechkarov CD-R groove measurement by phase stepping interferometry Opt. Laser Eng. 36 2001 429 435
    • (2001) Opt. Laser Eng. , vol.36 , pp. 429-435
    • Sainov, V.1    Mechkarov, N.2
  • 16
    • 84975571114 scopus 로고    scopus 로고
    • Superresolution in confocal scanning microscopy
    • T. Wilson, and S.J. Hewlett Superresolution in confocal scanning microscopy Opt. Lett. 16 1996 1062 1064
    • (1996) Opt. Lett. , vol.16 , pp. 1062-1064
    • Wilson, T.1    Hewlett, S.J.2
  • 18
    • 0001125824 scopus 로고    scopus 로고
    • Fundamental limits of optical superresolution
    • T.R.M. Sales, and G.M. Morris Fundamental limits of optical superresolution Opt. Lett. 22 1997 582 584
    • (1997) Opt. Lett. , vol.22 , pp. 582-584
    • Sales, T.R.M.1    Morris, G.M.2
  • 19
    • 0035329852 scopus 로고    scopus 로고
    • New approach to supperresolution
    • H. Wang New approach to supperresolution Opt. Eng. 40 2001 851 855
    • (2001) Opt. Eng. , vol.40 , pp. 851-855
    • Wang, H.1
  • 20
    • 0032070956 scopus 로고    scopus 로고
    • High-frequency enhancement by an optical system for superresolution of temporally restricted objects
    • D. Mendlovic, D. Farkas, Z. Zalevsky, and A. Lohmann High-frequency enhancement by an optical system for superresolution of temporally restricted objects Opt. Lett. 23 1998 801 803
    • (1998) Opt. Lett. , vol.23 , pp. 801-803
    • Mendlovic, D.1    Farkas, D.2    Zalevsky, Z.3    Lohmann, A.4
  • 22
    • 2542633125 scopus 로고    scopus 로고
    • Key measurement technique for ultraprecision discontinuous cylindrical form
    • Harbin Institute of Technology Harbin
    • W. Zhao Key measurement technique for ultraprecision discontinuous cylindrical form Doctor Degree Dissertation 2003 Harbin Institute of Technology Harbin pp. 31-38
    • (2003) Doctor Degree Dissertation
    • Zhao, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.