Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection

Review of Scientific Instruments

Volumn 70, Issue 7, 1999, Pages 3068-3073

  Higurashi, Eiji ^a   Sawada, Renshi ^a   Ito, Takahiro ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043136635     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149868     Document Type: Article

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