Millimeter-wave scanning near-field anisotropy microscopy

Review of Scientific Instruments

Volumn 76, Issue 3, 2005, Pages

  Nozokido, Tatsuo ^a   Iibuchi, Ryohei ^a   Bae, Jongsuck ^a   Mizuno, Koji ^a   Kudo, Hiroyuki ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL ANISOTROPY; MICROSCOPE SYSTEMS; NEAR-FIELD MICROSCOPY; SLIT-TYPE PROBE;

ANISOTROPY; ELECTRIC PROPERTIES; IMAGE RECONSTRUCTION; MATHEMATICAL MODELS; MILLIMETER WAVE DEVICES; OPTICAL WAVEGUIDES; PROBES; SCANNING;

MICROSCOPIC EXAMINATION;

EID: 17044424495     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1866255     Document Type: Article

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