A new object mounting structure for use in millimeter-wave scanning near-field microscopy

IEICE Electronics Express

Volumn 1, Issue 6, 2004, Pages 144-149

  Nozokido, Tatsuo ^a   Nuimura, Shuji ^a   Hamano, Tetze ^a   Bae, Jongsuck ^a   Mizuno, Koji ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

anti reflection (AR) layers; hemispherical lenses; millimeter waves; object mounting structures; scanning near field microscopy

Indexed keywords

EID: 85010131386     PISSN: 13492543     EISSN: None     Source Type: Journal    
DOI: 10.1587/elex.1.144     Document Type: Article

References (10)

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