Scanning near-field millimeter-wave microscopy using a metal slit as a scanning probe

IEEE Transactions on Microwave Theory and Techniques

Volumn 49, Issue 3, 2001, Pages 491-499

  Nozokido, Tatsuo ^a,b   Bae, Jongsuck ^a,b   Mizuno, Koji ^a,b  

^a IEEE   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Free carriers; Millimeter wave; Scanning near field microscopy; Slit type probe; Visualization

Indexed keywords

SCANNING PROBES;

ALGORITHMS; CHARGE CARRIERS; COMPUTERIZED TOMOGRAPHY; IMAGE RECONSTRUCTION; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL WAVEGUIDES; SEMICONDUCTING SILICON;

PROBES;

EID: 0035273826     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.910553     Document Type: Article

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