Trends and challenges of large scale embedded memories

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2004, Pages 449-456

  Furuyama, Tohru ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; EMBEDDED SYSTEMS; ENERGY UTILIZATION; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; MOSFET DEVICES; SEMICONDUCTING SILICON; SPECIFICATIONS; SPURIOUS SIGNAL NOISE; STATIC RANDOM ACCESS STORAGE;

DIGITAL CONSUMER SYSTEM PRODUCTS; EMBEDDED MEMORIES; STATIC NOISE MARGIN (SNM); SYSTEM ON A CHIP (SOC) DEVICES;

DATA STORAGE EQUIPMENT;

EID: 17044411703     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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