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Volumn , Issue , 2002, Pages 357-360
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Robustness IPs for reliability and security of SoCs
a a
a
NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONICS INDUSTRY;
INTEGRATED CIRCUIT LAYOUT;
MARKETING;
MICROPROCESSOR CHIPS;
RADIATION EFFECTS;
RELIABILITY;
SECURITY OF DATA;
SEMICONDUCTING SILICON;
VLSI CIRCUITS;
REGISTER TRANSFER LEVEL;
SIGNAL INTEGRITY;
VERY DEEP SUBMICRON;
INTEGRATED CIRCUIT TESTING;
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EID: 0036446821
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (3)
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