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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 19, Issue 4, 2001, Pages 1763-1768

Calibrated magnetic force microscopy measurement of current-carrying lines

(3) Yongsunthon, R a Mccoy, J a Williams, E D a

a University of Maryland (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038029375 PISSN: 07342101 EISSN: 15208559 Source Type: Journal
DOI: 10.1116/1.1379325 Document Type: Conference Paper

Times cited : (15)

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