Reconstruction of current flow and imaging of current- limiting defects in polycrystalline superconducting films

Science

Volumn 275, Issue 5298, 1997, Pages 367-369

  Pashitski, A E ^a   Gurevich, A ^a   Polyanskii, A A ^a,d   Larbalestier, D C ^a   Goyal, A ^b   Specht, E D ^b   Kroeger, D M ^b   DeLuca, J A ^c   Tkaczyk, J E ^c  

^a University of Wisconsin Madison   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c GENERAL ELECTRIC COMPANY   (United States)

^d INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; FLOW PATTERNS; GRAIN BOUNDARIES; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; MAGNETIC FIELDS; MAGNETOOPTICAL EFFECTS; POLYCRYSTALLINE MATERIALS; TEXTURES; THALLIUM COMPOUNDS; TRANSPORT PROPERTIES;

CURRENT FLOW; CURRENT LIMITING DEFECTS; INHOMOGENEOUS PENETRATION; MAGNETIC FLUX; MAGNETOOPTICAL IMAGING; POLYCRYSTALLINE FILMS;

SUPERCONDUCTING FILMS;

ARTICLE; CONDUCTOR; CRYSTALLOGRAPHY; IMAGE DISPLAY; IMAGE RECONSTRUCTION; MAGNETIC FIELD; OPTICS; PHYSICS; PRIORITY JOURNAL;

EID: 0031024774     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.275.5298.367     Document Type: Article

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34. The work at University of Wisconsin was supported by the NSF Materials Research Group Program (DMR 9214707) and the Electric Power Research Institute (RP 8009-5). The work at Oak Ridge National Laboratory is managed by Lockheed Martin Energy Research for the U.S. Department of Energy (DOE) under contract DE-AC05-96OR22464. The work was partly conducted at the National Synchrotron Light Source, which is supported by DOE under contract DE-AC02-76CH00016.