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Volumn 275, Issue 5298, 1997, Pages 367-369

Reconstruction of current flow and imaging of current- limiting defects in polycrystalline superconducting films

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; FLOW PATTERNS; GRAIN BOUNDARIES; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; MAGNETIC FIELDS; MAGNETOOPTICAL EFFECTS; POLYCRYSTALLINE MATERIALS; TEXTURES; THALLIUM COMPOUNDS; TRANSPORT PROPERTIES;

EID: 0031024774     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.275.5298.367     Document Type: Article
Times cited : (83)

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    • 0 should be excluded to avoid fictitious short-wavelength noise currents and thus to make the inversion scheme stable (16). We set (victory hand) = 0.8 μm. but because (victory hand) is much smaller than the spatial resolution of our MO technique, the calculated J(r) only very weakly depends on (victory hand).
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    • The work at University of Wisconsin was supported by the NSF Materials Research Group Program (DMR 9214707) and the Electric Power Research Institute (RP 8009-5). The work at Oak Ridge National Laboratory is managed by Lockheed Martin Energy Research for the U.S. Department of Energy (DOE) under contract DE-AC05-96OR22464. The work was partly conducted at the National Synchrotron Light Source, which is supported by DOE under contract DE-AC02-76CH00016.


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