Application of atomic force microscopy to magnetic materials

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 6, Issue 2, 1988, Pages 279-282

  GrUtter P ^a   Meyer, E ^a   Heinzelmann, H ^a   Rosenthaler, L ^a   Hidber, H R ^a   GUntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84953677225     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.575425     Document Type: Article

References (11)

1. R. J. Celotta and D. T. Pierce, Science 234,333 (1986).
2. G. G. Hembree, J. Unguris, R. J. Celotta, and D. T. Pierce, Scanning Microscopy Suppl. 1,229 (1987).
3. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
4. Y. Martin and H. K. Wickramasinghe, Appl. Phys. Lett. 50,1455 (1987).
5. J. J. Saenz, N. Garcia, P. Griitter, E. Meyer, H. Heinze Imann, R. Wiesendanger, L. Rosenthaler, H.-R. Hidber, and H.-J. Giintherodt. J. Appl. Phys. 62,4293 (1987).
6. R. Heinzelmann, P. Griitter, E. Meyer, L. Rosenthaler, H.-R. Hidber, and H.-I. Giintherodt, Surf. Sci. 189/190, 29 (1987).
7. U. Diirig, J. K. Girnzewski, and D. W. Pohl, Phys. Rev. Lett. 57, 2403 (1986).
8. H. Heinzelmann, E. Meyer, P. Griitter, L. Rosenthaler, H.-R. Hidber, and H.-J. Giintherodt, J. Vac. Sci. Technol. A 6, 275 (1988) (these proceedings).
9. T. Suzuki, K. Hiraga, and M. Sagawa. Jpn. J. Appl. Phys. 23, L421 (1984).
10. K. E. Petersen, Proc. IEEE 70, 420 (1982).
11. G. M. McClelland, R. Erlandson, and S. Chiang, Rev. Progr. Quant, Non-Destruct. Eval. 6 (1987).