Quantitative magnetic field measurements with the magnetic force microscope

Applied Physics Letters

Volumn 69, Issue 17, 1996, Pages 2599-2601

  Proksch, Roger ^a   Skidmore, George D ^b   Dahlberg, E Dan ^b   Foss, Sheryl ^b   Schmidt, J J ^b   Merton, Chris ^b   Walsh, Brian ^a   Dugas, Matt ^c  

^a ST OLAF COLLEGE   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

^c Advanced Research Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001369150     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117712     Document Type: Article

References (22)

1. G. Binnig, C. F. Quate, and C. Gerber. Phys. Rev. Lett. 56, 930 (1986).
2. P. Grütter, E. Meyer, H. Heinzelmann, L. Rosenthaler, H.-R. Hidber, and H.-J. Güntherodt, J. Vac. Sci. Technol. A 6, 279 (1992).
3. A. Moser, H. J. Hug, I. Parashikov, B. Stiefel, O. Fritz, H. Thomas, A. Baratoff, and H.-J. Güntherodt, Phys. Rev. Lett. 74, 1847 (1995).
4. P. Grütter, A. Wadas, E. Meyer, H. Heinzelmann, H.-R. Hidber, and H.-J. Güntherodt, J. Vac. Sci. Technol. A 8, 406 (1990).
5. H. J. Mamin, D. Rugar, J. E. Stern, R. E. Fontant, Jr., and P. Kasiraj, Appl. Phys. Lett. 55, 318 (1989); Y. Luo and J.-G. Zhu, IEEE Trans. Magn. 30, 4080 (1994).
6. H. J. Mamin, D. Rugar, J. E. Stern, R. E. Fontant, Jr., and P. Kasiraj, Appl. Phys. Lett. 55, 318 (1989); Y. Luo and J.-G. Zhu, IEEE Trans. Magn. 30, 4080 (1994).
7. T. Ohkubo, Y. Maeda, and Y. Koshimoto, IEICE Trans. Electron E78-C, 1523 (1995).
8. A. Wadas and H.-J. Hug, J. Appl. Phys. 72, 203 (1992); R. B. Proksch, T. E. Schäffer, B. Moskowitz, E. D. Dahlberg, D. A. Bazylinski, and R. B. Frankel, Appl. Phys. Lett. 66, 2582 (1995).
9. A. Wadas and H.-J. Hug, J. Appl. Phys. 72, 203 (1992); R. B. Proksch, T. E. Schäffer, B. Moskowitz, E. D. Dahlberg, D. A. Bazylinski, and R. B. Frankel, Appl. Phys. Lett. 66, 2582 (1995).
10. D. Gordon and R. Brown, IEEE Trans. Magn. 8, 76 (1972).
11. O. Wolter, Th. Bayer, and J. Greschner, J. Vac. Sci. Technol. B 9, 1353 (1991).
12. M. Rührig, S. Porthun, and J. C. Lodder, Rev. Sci. Instrum. 65, 3224 (1994); M. Rührig, S. Porthun, J. C. Lodder, S. McVitie, L. J. Heyderman, A. B. Johnston, and J. N. Chapman, J. Appl. Phys. 79, 2913 (1996).
13. M. Rührig, S. Porthun, and J. C. Lodder, Rev. Sci. Instrum. 65, 3224 (1994); M. Rührig, S. Porthun, J. C. Lodder, S. McVitie, L. J. Heyderman, A. B. Johnston, and J. N. Chapman, J. Appl. Phys. 79, 2913 (1996).
14. The hysteresis loops of the MFM tips used in this work were measured as follows: The tip was positioned above the center of a bit transition. While maintaining a constant position, the external field was ramped between ± 450 Oe. The response of the MFM depends on the magnetic state of the tip [see Eq. (1)], which changes in the applied field. The result is a hysteresis loop of the MFM response versus applied field. Although this technique does not give a quantitative value for the tip moment, it does give quantitative values for the coercivity and saturation field. The field offset gives the value of the magnetic field due to the sample at the tip location, albeit at a much slower rate than possible with the fluxgate-MFM. This result also depends on the sample magnetic structure remaining unaffected by the applied magnetic field. Although we do not have definitive proof that this is the case, conventional MFM images made before and after this measurement showed no measurable changes in the micromagnetic structure.
15. Q. Zhong, D. Inniss, K. Kjoller, and V. B. Elings. Surf. Sci. 290, L688 (1993).
16. D. Rugar, H. J. Mamin, P. Guethner, S. E. Lambert, J. E. Stern, I. McFayden, and T. Yogi, J. Appl. Phys. 68, 1169 (1990).
17. P. Langevin, Ann. Chem. Phys. 5, 70 (1905).
18. R. I. Potter, J. Appl. Phys. 41, 1648 (1970).
19. U. Hartmann, J. Appl. Phys. 64, 1561 (1988); H. J. Mamin, D. Rugar, J. E. Stern, R. E. Fontana, and P. Kasiraj, Appl. Phys. Lett. 55, 5932 (1990)
20. U. Hartmann, J. Appl. Phys. 64, 1561 (1988); H. J. Mamin, D. Rugar, J. E. Stern, R. E. Fontana, and P. Kasiraj, Appl. Phys. Lett. 55, 5932 (1990)
21. A. M. Chang, H. D. Hallen, L. Harriott, H. Hess, H. Kao, J. Kwo, R. E. Miller, R. Wolfe, and J. van der Ziel, Appl. Phys. Lett. 61, 1974 (1992).
22. J. Kirtley, M. Ketchen, K. Stawiasz, J. Sun, W. Gallagher, S. Blanton, and S. Wind, Appl. Phys. Lett. 66, 1138 (1995).