Revised Method for Extraction of the Thermal Resistance Applied to Bulk and SOI SiGe HBTs

IEEE Electron Device Letters

Volumn 25, Issue 3, 2004, Pages 150-152

  Vanhoucke, T ^a   Boots, H M J ^a   Van Noort, W D ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Heterojunction bipolar transistors (HBTs); Self heating; Silicon on insulator (SOI) technology; Thermal resistance

Indexed keywords

CURRENT DENSITY; HEAT RESISTANCE; MATHEMATICAL MODELS; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY; THERMAL CONDUCTIVITY;

POWER DISSIPATION; SELF-HEATING; SILICON-ON-INSULATOR (SOI) TECHNOLOGY;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 1642290883     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2004.824242     Document Type: Article

References (11)

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